Furthermore, the findings presented herein represent an exciting new opportunity in soil analysis; without the need for spectral soil libraries, chemical pre-treatment, or lab conditions, SOC can be measured rapidly with the SciAps handheld LIBS.

The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors.

The X-550 analyzes common alloys in 1 second or less. For alloys requiring longer test times or two-beam analysis, pre-configured on-board apps assure quality testing by every operator